October 15, 2007
By: by SÃle McMahon, Fabtech.org
Nanoelectrics metrology expert Dr Alain Diebold has joined the CNSE at the University of Albany as an Empire Innovation Professor of Nanoscale Science and Executive Director of CNSE's Nanoscale Metrology and Imaging Center.
Dr. Diebold's past has seen him found the Analytical Laboratory Managers Council for International SEMATECH; found and co-chair the group of initial creators of the ITRS (International Technology Roadmap for Semiconductors); and be dubbed a SEMATECH Senior Fellow after an 18-year tenure with the organization.
"I am delighted to welcome Dr. Diebold to the UAlbany NanoCollege, where his extensive background and recognized expertise in the area of metrology will make him a valuable asset. His work will enhance CNSE's drive for worldwide excellence in nanoscale education, research and commercialization," said Dr. Alain E. Kaloyeros, Vice President and Chief Administrative Officer of CNSE. "In addition, his presence as a member of our growing faculty serves to provide still another world-class resource for our global corporate and university partners, who represent the world's leading nanoelectronics companies and organizations."
Dr. Diebold has written in nearly 100 technical publications, has held various senior-level R&D positions with Honeywell (formerly Allied Signal) and edited the Handbook of Silicon Semiconductor Metrology. He has performed undergraduate and postgraduate research in theoretical and chemical physics at Purdue University, and did a post-doctoral fellowship on experimental surface science at Penn State University.
The Nanoscale Metrology and Imaging Center was set up by CNSE to support the development of technologies and devices for thin film and materials analysis techniques.