Monday, May 24, 2010
- Friday, May 28, 2010
TIME: 4:00 PM
- 6:00 PM
The 5th International Conference on Spectroscopic Ellipsometry (ICSE-V) will be held at the College of Nanoscale Science and Engineering (CNSE). ICSE-V is the premier forum for the international community of scientists and engineers working in the field of ellipsometry and related measurement techniques. ICSE-V covers new advances and developments in science, technology, and applications of spectroscopic ellipsometry, including the related optical analysis techniques that commonly exploit polarization. The conference expands on the topics covered at the four previous events held in Paris, France (ICSE-1, 1993), Charleston, SC (ICSE-2, 1997), Vienna, Austria (ICSE-3, 2003), and Stockholm, Sweden (ICSE-4, 2007) by adding new areas such as non-linear optical measurements and further emphasizing related polarization techniques.
For more information on this conference, please visit the
Location: College of Nanoscale Science and Engineering | 257 Fuller Rd. Albany NY 12203Return to previous page